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JEOL Secondary Electron Detector JWS-2000 Wafer Defect Review SEM Working Model No: H628 WTR V1

SKU: 67897705776

4.5
USD437.00 USD467.00

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Ships within 48 hours · Estimated delivery Jul 24 - Jul 29

Description

Model No: H628 WTR V1

This UNIT Instruments UFC-8161 is used working surplus

Removed from a Kokusai Electric Zestone V DD-1203V Vertical Diffusion Furnace This Kokusai Temperature Controller Nozzle and Clamp Line Zestone V is used working surplus

This UNIT Instruments 1100-100039 is used working surplus

Inventory # A-13912

JEOL Secondary Electron Detector JWS-2000 Wafer Defect Review SEM Working Model No: H628 WTR V1JEOL Secondary Electron Detector JWS 2000 Wafer Defect Review SEM Working Part No: Secondary Electron Detector Removed from a JEOL JWS 2000 Wafer Defect Review SEM Scanning Electron Microscope System This item is working surplus. The physical condition is good, but there are signs of previous use and handling. Sale Details Item Condition: Working, 90 Day Warranty Estimated Packed Shipping Dimensions: L x W x H = 12"x12"x12" @ 3 lbs. Only items

Exchange/Return Notes
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  • Final sale items are not eligible for returns or exchanges.
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